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D'Acapito, Francesco and Golosio, Bruno and Shimizu, Y. and Scalese, Silvia and Italia, M. and Alippi, Paola and Grasso, S. (2007) The site of in dopants in Si. In: X-ray absorption fine structure - XAFS 13: 13th International Conference, July 9-14, 2006, Stanford (CA), USA. Melville, American Institute of Physics. p. 375-377. (AIP Conference Proceedings, 882). ISBN 978-0-7354-0384-0. Conference or Workshop Item.

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