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Quantitative phase retrieval with picosecond X-ray pulses from the ATF Inverse Compton Scattering source

Endrizzi, Marco and Gureyev, T. E. and Delogu, Pasquale and Oliva, Piernicola and Golosio, Bruno and Carpinelli, Massimo and Pogorelsky, I. and Yakimenko, V. and Bottigli, Ubaldo (2011) Quantitative phase retrieval with picosecond X-ray pulses from the ATF Inverse Compton Scattering source. Optics Express, Vol. 19 (3), p. 2748-2753. eISSN 1094-4087. Article.

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DOI: 10.1364/OE.19.002748

Abstract

Quantitative phase retrieval is experimentally demonstrated using the Inverse Compton Scattering X-ray source available at the Accelerator Test Facility (ATF) in the Brookhaven National Laboratory. Phase-contrast images are collected using in-line geometry, with a single X-ray pulse of approximate duration of one picosecond. The projected thickness of homogeneous samples of various polymers is recovered quantitatively from the time-averaged intensity of transmitted X-rays. The data are in good agreement with the expectations showing that ATF Inverse Compton Scattering source is suitable for performing phase-sensitive quantitative X-ray imaging on the picosecond scale. The method shows promise for quantitative imaging of fast dynamic phenomena.

Item Type:Article
ID Code:6243
Status:Published
Refereed:Yes
Uncontrolled Keywords:Inverse Compton Scattering (ICS), X-ray source
Subjects:Area 02 - Scienze fisiche > FIS/07 Fisica applicata (a beni culturali, ambientali, biologia e medicina)
Divisions:001 Università di Sassari > 03 Istituti > Matematica e fisica
Publisher:Optical Society of America
eISSN:1094-4087
Copyright Holders:© 2011 Optical Society of America
Deposited On:11 Jul 2011 15:56

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