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Endrizzi, Marco and Gureyev, T. E. and Delogu, Pasquale and Oliva, Piernicola and Golosio, Bruno and Carpinelli, Massimo and Pogorelsky, I. and Yakimenko, V. and Bottigli, Ubaldo (2011) Quantitative phase retrieval with picosecond X-ray pulses from the ATF Inverse Compton Scattering source. Optics Express, Vol. 19 (3), p. 2748-2753. eISSN 1094-4087. Article. Full text not available from this repository. DOI: 10.1364/OE.19.002748 AbstractQuantitative phase retrieval is experimentally demonstrated using the Inverse Compton Scattering X-ray source available at the Accelerator Test Facility (ATF) in the Brookhaven National Laboratory. Phase-contrast images are collected using in-line geometry, with a single X-ray pulse of approximate duration of one picosecond. The projected thickness of homogeneous samples of various polymers is recovered quantitatively from the time-averaged intensity of transmitted X-rays. The data are in good agreement with the expectations showing that ATF Inverse Compton Scattering source is suitable for performing phase-sensitive quantitative X-ray imaging on the picosecond scale. The method shows promise for quantitative imaging of fast dynamic phenomena.
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