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X-ray tomography using a CMOS area detector

Brunetti, Antonio and Cesareo, Roberto (2007) X-ray tomography using a CMOS area detector. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 258 (2), p. 485-489. ISSN 0168-583X. Article.

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DOI: 10.1016/j.nimb.2007.02.067

Abstract

A flat panel based on CMOS technology represents a valid alternative to other kinds of flat panels and to ccd detectors for X-ray imaging. Although the spatial resolution of the ccd sensors is better than that of a CMOS sensor, the last has a larger sensitive-area and it can work at room temperature reaching a dynamic performance comparable to that of a cooled ccd sensor. Other kinds of flat panels, such as TFT screen are much more expensive and they have lower spatial resolution and higher noise than the CMOS detector.
In this paper, an application of the CMOS sensor to X-ray tomography is described. Preliminary results are reported and discussed.

Item Type:Article
ID Code:4666
Status:Published
Refereed:Yes
Uncontrolled Keywords:Flat panel, imaging, tomography
Subjects:Area 02 - Scienze fisiche > FIS/07 Fisica applicata (a beni culturali, ambientali, biologia e medicina)
Divisions:001 Università di Sassari > 03 Istituti > Matematica e fisica
Publisher:North Holland / Elsevier Science
ISSN:0168-583X
Deposited On:12 Oct 2010 16:33

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