Metal location and thickness in a multilayered sheet by measuring Kα/Kβ, Lα/Lβ and Lα/Lγ X-ray ratios

Metal location and thickness in a multilayered sheet by measuring Kα/Kβ, Lα/Lβ and Lα/Lγ X-ray ratios

Cesareo, Roberto and Rizzutto, Marcia A. and Brunetti, Antonio and Rao, Donepudi Venkateswara (2009) Metal location and thickness in a multilayered sheet by measuring Kα/Kβ, Lα/Lβ and Lα/Lγ X-ray ratios. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 267 (17), p. 2890-2896. ISSN 0168-583X. Article.

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DOI: 10.1016/j.nimb.2009.06.119

Abstract

When a multilayered material is analyzed by means of energy-dispersive X-ray fluorescence analysis, then the X-ray ratios of Kα/Kβ, or Lα/Lβ and Lα/Lγ, for an element in the multilayered material, depend on the composition and thickness of the layer in which the element is situated, and on the composition and thickness of the superimposed layer (or layers).
Multilayered samples are common in archaeometry, for example, in the case of pigment layers in paintings, or in the case of gilded or silvered alloys. The latter situation is examined in detail in the present paper, with a specific reference to pre-Columbian alloys from various museums in the north of Peru.

Item Type:	Article
ID Code:	4651
Status:	Published
Refereed:	Yes
Uncontrolled Keywords:	Energy-dispersive X-ray fluorescence, Kα/Kβ; Lα/Lβ and Lα/Lγ-ratios, pigment layers, gilded alloys, silvered alloys
Subjects:	Area 02 - Scienze fisiche > FIS/07 Fisica applicata (a beni culturali, ambientali, biologia e medicina)
Divisions:	001 Università di Sassari > 03 Istituti > Matematica e fisica
Publisher:	North Holland / Elsevier Science
ISSN:	0168-583X
Deposited On:	12 Oct 2010 12:07

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