Cesareo, Roberto and Rizzutto, Marcia A. and Brunetti, Antonio and Rao, Donepudi Venkateswara (2009) Metal location and thickness in a multilayered sheet by measuring Kα/Kβ, Lα/Lβ and Lα/Lγ X-ray ratios. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 267 (17), p. 2890-2896. ISSN 0168-583X. Article.
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When a multilayered material is analyzed by means of energy-dispersive X-ray fluorescence analysis, then the X-ray ratios of Kα/Kβ, or Lα/Lβ and Lα/Lγ, for an element in the multilayered material, depend on the composition and thickness of the layer in which the element is situated, and on the composition and thickness of the superimposed layer (or layers).
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