Simionovici, Alexandre and Bleuet, Pierre and Golosio, Bruno and Schroer, Christian (2008) Scanning tomography. In: Banhart, John (ed). Advanced tomographic methods in materials research and engineering, Oxford; New York, Oxford University Press. p. 224-261. ISBN 978-0-19-921324-5. Book Section.
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In cases where the effect of interest changes the direction of the incoming radiation, the image pixels are no longer decoupled and the sample has to be scanned sequentially using a small focused beam to avoid the information from different regions of the sample being convoluted irreversibly. This chapter describes such scanning methods. Three examples are presented: tomography using fluorescent X-ray radiation, tomography exploiting the absorption fine structure near the absorption edges, and tomography utilizing small-angle scattering from mesoscopic structures within the sample.
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