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Internal elemental microanalysis combining x-ray fluorescence, Compton and transmission tomography

Golosio, Bruno and Simionovici, Alexandre and Somogyi, Andrea and Lemelle, Laurence and Chukalina, Marina and Brunetti, Antonio (2003) Internal elemental microanalysis combining x-ray fluorescence, Compton and transmission tomography. Journal of Applied Physics, Vol. 94 (1), p. 145-156. eISSN 1089-7550. Article.

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DOI: 10.1063/1.1578176

Abstract

Conventional x-ray transmission tomography provides the spatial distribution of the absorption coefficient inside a sample. Other tomographic techniques, based on the detection of photons coming from fluorescent emission, Compton and Rayleigh scattering, are used for obtaining information on the internal elemental composition of the sample. However, the reconstruction problem for these techniques is generally much more difficult than that of transmission tomography, mainly due to self-absorption effects in the sample. In this article an approach to the reconstruction problem is presented, which integrates the information from the three types of signals. This method provides the quantitative spatial distribution of all elements that emit detectable fluorescent lines (Z≥=15 in usual experimental conditions), even when the absorption effects are strong, and the spatial distribution of the global density of the lighter elements. The use of this technique is demonstrated on the reconstruction of a grain of the martian meteorite NWA817, mainly composed of low Z elements not measured in fluorescence and for which this method provides a unique insight. The measurement was done at the ID22 beamline of the European Synchrotron Radiation Facility.

Item Type:Article
ID Code:2007
Status:Published
Refereed:Yes
Uncontrolled Keywords:X-ray fluorescence analysis, Compton effect, tomography, Rayleigh scattering, signal reconstruction, Monte Carlo methods, meteorites, mars
Subjects:Area 02 - Scienze fisiche > FIS/07 Fisica applicata (a beni culturali, ambientali, biologia e medicina)
Divisions:001 Università di Sassari > 03 Istituti > Matematica e fisica
Publisher:American Institute of Physics
eISSN:1089-7550
Deposited On:18 Aug 2009 10:06

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